4 search results - page 1 / 1 » Efficient Modular Testing of SOCs Using Dual-Speed TAM Archi... |
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
ET
2002
13 years 4 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
DAC
2008
ACM
14 years 5 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
DSD
2005
IEEE
13 years 10 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...