127 search results - page 2 / 26 » Efficiently generating test vectors with state pruning |
DAC
1994
ACM
13 years 9 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
DATE
1997
IEEE
13 years 9 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
TACAS
2005
Springer
13 years 10 months ago
2005
Springer
Object-oriented unit tests consist of sequences of method invocations. Behavior of an invocation depends on the method’s arguments and the state of the receiver at the beginning ...