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    TVLSI
    2002
    73views more  TVLSI 2002»
    Electrical interconnects revitalized
    13 years 4 months ago
    Electrical interconnects revitalized
    Download  www.ek.isy.liu.se
    C. Svensson
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    ISCAS
    2005
    IEEE
    117views Hardware» more  ISCAS 2005»
    Electrical and optical on-chip interconnects in scaled microprocessors
    13 years 10 months ago
    Electrical and optical on-chip interconnects in scaled microprocessors
    Download  www.csl.cornell.edu
    Abstract— Interconnect has become a primary bottleneck in integrated circuit design. As CMOS technology is scaled, it will become increasingly difficult for conventional copper ...
    Guoqing Chen, Hui Chen, Mikhail Haurylau, Nicholas...
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    ASPDAC
    2008
    ACM
    85views Hardware» more  ASPDAC 2008»
    ORB: An on-chip optical ring bus communication architecture for multi-processor systems-on-chip
    13 years 7 months ago
    ORB: An on-chip optical ring bus communication architecture for multi-processor systems-on-chip
    Download  www.engr.colostate.edu
    Abstract
    Sudeep Pasricha, Nikil Dutt
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    MR
    2002
    64views Robotics» more  MR 2002»
    Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive int
    13 years 4 months ago
    Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive int
    Download  www.ee.cityu.edu.hk
    Anisotropic conductive adhesive film (ACF) has been extensively used in the liquid crystal display (LCD) industry for decades on chip-on-glass (COG) applications. It offers the ad...
    Y. W. Chiu, Y. C. Chan, S. M. Lui
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    VLSID
    2007
    IEEE
    103views VLSI» more  VLSID 2007»
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    14 years 5 months ago
    Impact of Modern Process Technologies on the Electrical Parameters of Interconnects
    Download  www.eecs.northwestern.edu
    Abstract-- This paper presents the results obtained from an experimental study of the impact of modern process technologies on the electrical parameters of interconnects. Variation...
    Debjit Sinha, Jianfeng Luo, Subramanian Rajagopala...
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