67 search results - page 1 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
ITC
2002
IEEE
13 years 10 months ago
2002
IEEE
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
FDTC
2010
Springer
13 years 3 months ago
2010
Springer
The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing