485 search results - page 2 / 97 » Embedded intelligent SRAM |
DATE
2009
IEEE
14 years 2 days ago
2009
IEEE
Abstract— This paper presents a six-transistor (6T) singleended static random access memory (SE-SRAM) bitcell with an isolated read-port, suitable for low-Î and low-power embedd...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [7, 8]. The improve...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE