13 search results - page 2 / 3 » Emerging Yield and Reliability Challenges in Nanometer CMOS ... |
ISPD
2004
ACM
13 years 10 months ago
2004
ACM
As technology advances into nanometer territory, the antenna problem has caused significant impact on routing tools. The antenna effect is a phenomenon of plasmainduced gate oxide...
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
ISQED
2010
IEEE
13 years 3 months ago
2010
IEEE
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
ISCA
2010
IEEE
13 years 10 months ago
2010
IEEE
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...