— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
Abstract. The problem of reliably transmitting a real-valued random vector through a digital noisy channel is relevant for the design of distributed estimation and control techniqu...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
In this paper we introduce a new curvature estimator based on global optimisation. This method called Global Min-Curvature exploits the geometric properties of digital contours by ...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...