72 search results - page 1 / 15 » Estimation and optimization of reliability of noisy digital ... |
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
SIAMCO
2010
13 years 3 months ago
2010
Abstract. The problem of reliably transmitting a real-valued random vector through a digital noisy channel is relevant for the design of distributed estimation and control techniqu...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
DGCI
2008
Springer
13 years 6 months ago
2008
Springer
In this paper we introduce a new curvature estimator based on global optimisation. This method called Global Min-Curvature exploits the geometric properties of digital contours by ...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...