4 search results - page 1 / 1 » Estimation of maximum power supply noise for deep sub-micron... |
ISLPED
1998
ACM
13 years 9 months ago
1998
ACM
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
One of the fundamental problems in Deep Sub Micron (DSM) circuits is Simultaneous Switching Noise (SSN), which causes voltage fluctuations in the circuit power/ground networks. In...
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
TVLSI
2008
13 years 5 months ago
2008
Decoupling capacitors are widely used to reduce power supply noise. On-chip decoupling capacitors have traditionally been allocated into the white space available on a die or place...