68 search results - page 1 / 14 » Evaluation of voltage interpolation to address process varia... |
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
Abstract— Post-fabrication tuning provides a promising design approach to mitigate the performance and power overheads of process variation in advanced fabrication technologies. ...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
— Voltage interpolation is a promising post fabrication technique for combating the effects of process variations. The benefits of voltage interpolation are well understood. It...
ISCA
2008
IEEE
13 years 11 months ago
2008
IEEE
Process variations are poised to significantly degrade performance benefits sought by moving to the next nanoscale technology node. Parameter fluctuations in devices can introd...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
Parameter variations are a major factor causing powerperformance asymmetry in chip multiprocessors. In this paper, we analyze the effects of with-in-die (WID) process variations o...
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
— In a nanoscale technology, memory bits are highly susceptible to process variation induced read/write failures. To address the above problem, in this paper a new memory cell is...