Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Mat...
This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory. Te...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
The CLA-EC is a model obtained by combining the concepts of cellular learning automata and evolutionary algorithms. The parallel structure of the CLA-EC makes it suitable for hard...