32 search results - page 1 / 7 » Fast Sequential Circuit Test Generation Using High-Level and... |
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
ET
2000
13 years 4 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
ICTAI
2002
IEEE
13 years 9 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...