15 search results - page 3 / 3 » Fast transient power and noise estimation for VLSI circuits |
DAC
2003
ACM
13 years 10 months ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
DFT
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
This paper proposes a fast decoupling capacitance (decap) allocation and budgeting algorithm for both early stage decap estimation and later stage decap minimization in today’s ...
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
ISLPED
2004
ACM
13 years 10 months ago
2004
ACM
We present a novel temperature/leakage sensor, developed for high-speed, low-power, monitoring of processors and complex VLSI chips. The innovative idea is the use of 4T SRAM cell...