102 search results - page 4 / 21 » Fault Detection Likelihood of Test Sequence Length |
ATS
1998
IEEE
13 years 10 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
DATE
2002
IEEE
13 years 11 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
ICSM
2007
IEEE
14 years 11 days ago
2007
IEEE
Test suite reduction seeks to reduce the number of test cases in a test suite while retaining a high percentage of the original suite’s fault detection effectiveness. Most appro...
VTS
2006
IEEE
14 years 1 days ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
IJBRA
2006
13 years 6 months ago
2006
: Probabilistic models for biological sequences (DNA and proteins) are frequently used in bioinformatics. We describe statistical tests designed to detect the order of dependency a...