10 search results - page 1 / 2 » Fault Diagnosis Using Test Primitives in Random Access Memor... |
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
IOLTS
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
DFT
2009
IEEE
13 years 11 months ago
2009
IEEE
This paper presents the first implementation of Built-In Self-Test (BIST) of Field Programmable Gate Arrays (FPGAs) using a soft core embedded processor for reconfiguration of the...
ASPLOS
2006
ACM
13 years 10 months ago
2006
ACM
Concurrency bugs are among the most difficult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...