16 search results - page 1 / 4 » Fault Pattern Oriented Defect Diagnosis for Memories |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
EAAI
2010
13 years 4 months ago
2010
This paper addresses the problem of fault detection and isolation in railway track circuits. A track circuit can be considered as a large-scale system composed of a series of trim...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...