This paper proposes a new high-level technique for designing fault tolerant systems in SRAM-based FPGAs, without modifications in the FPGA architecture. Traditionally, TMR has bee...
Fernanda Lima, Luigi Carro, Ricardo Augusto da Luz...
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
As manufacturing technology enters the ultra-deep submicron era, wafer yields are destined to drop due to higher occurrence of physical defects on the die. This paper proposes a y...
Nicola Campregher, Peter Y. K. Cheung, George A. C...
This paper presents a novel approach to interconnect fault location for FPGAs during power-on sequence. The method is based on a concept known as fault grading which utilizes defec...
Nicola Campregher, Peter Y. K. Cheung, Milan Vasil...
Most application level fault tolerance schemes in literature are non-adaptive in the sense that the fault tolerance schemes incorporated in applications are usually designed witho...
Zizhong Chen, Ming Yang, Guillermo A. Francia III,...