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ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
13 years 9 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
ATS
1998
IEEE
76views Hardware» more  ATS 1998»
13 years 9 months ago
Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
Michael S. Hsiao, Srimat T. Chakradhar
VLSID
2002
IEEE
97views VLSI» more  VLSID 2002»
14 years 5 months ago
Multiple Faults: Modeling, Simulation and Test
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...
DSD
2005
IEEE
105views Hardware» more  DSD 2005»
13 years 11 months ago
Improved Fault Emulation for Synchronous Sequential Circuits
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
Jaan Raik, Peeter Ellervee, Valentin Tihhomirov, R...
ICCAD
1998
IEEE
75views Hardware» more  ICCAD 1998»
13 years 9 months ago
A fast, accurate, and non-statistical method for fault coverage estimation
We present a fast, dynamic fault coverage estimation technique for sequential circuits that achieves high degrees of accuracy by signi cantly reducing the number of injected fault...
Michael S. Hsiao