82 search results - page 16 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
DAC
2003
ACM
14 years 7 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
VTS
2005
IEEE
13 years 12 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
EURODAC
1994
IEEE
13 years 10 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
ASC
2011
13 years 1 months ago
2011
A new paradigm for online EH regeneration using Genetic Algorithms (GAs) called Competitive Runtime Reconfiguration (CRR) is developed where performance is assessed based upon a b...