142 search results - page 1 / 29 » Functional test generation for non-scan sequential circuits |
EURODAC
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ICCD
2006
IEEE
13 years 11 months ago
2006
IEEE
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
VLSID
1995
IEEE
13 years 9 months ago
1995
IEEE
DAC
1999
ACM
14 years 6 months ago
1999
ACM
