4 search results - page 1 / 1 » Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Par... |
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
TODAES
2008
13 years 4 months ago
2008
IJCAI
1989
13 years 6 months ago
1989
Is there one logical de nition of diagnosis? In this paper I argue that the answer to this question is \no". This paper is about the pragmatics of using logic for diagnosis w...
ATS
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...