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ISLPED
1996
ACM
78views Hardware» more  ISLPED 1996»
13 years 9 months ago
Gate-level current waveform simulation of CMOS integrated circuits
We present a new gate-level approach to current simulation. We use a symbolic model of current pulses that takes accurately into account the dependence on the switching conditions...
Alessandro Bogliolo, Luca Benini, Giovanni De Mich...
ISQED
2007
IEEE
151views Hardware» more  ISQED 2007»
13 years 11 months ago
Gate Level Statistical Simulation Based on Parameterized Models for Process and Signal Variations
We propose gate level statistical simulation to bridge the gap between the most accurate Monte Carlo SPICE simulation and the most efficient circuit level statistical static timi...
Bao Liu
ICCAD
1996
IEEE
151views Hardware» more  ICCAD 1996»
13 years 9 months ago
Expected current distributions for CMOS circuits
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
Dennis J. Ciplickas, Ronald A. Rohrer
VLSID
2005
IEEE
223views VLSI» more  VLSID 2005»
14 years 5 months ago
A New CMOS Current Conveyors Based Translinear Loop for Log-Domain Circuit Design
A novel topology for Translinear (TL) loops comprising of CMOS Second Generation Current Conveyors (CC-II) and diodes is proposed. The proposed methodology opens a new paradigm to...
Debashis Dutta, Wouter A. Serdijn, Swapna Banerjee...
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
13 years 9 months ago
Digital Integrated Circuit Testing using Transient Signal Analysis
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...