11 search results - page 1 / 3 » Generation of broadside transition fault test sets that dete... |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
DFT
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults...
ITC
1991
IEEE
13 years 8 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...