20 search results - page 1 / 4 » Identification and Test Generation for Primitive Faults |
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
ICCAD
1991
IEEE
13 years 8 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
ASPDAC
1998
ACM
13 years 9 months ago
1998
ACM
−This paper describes a new redundant fault identification algorithm with Exclusive-OR circuit reduction. The experimental results using this algorithm with a FAN-based test patt...