20 search results - page 4 / 4 » Identification and Test Generation for Primitive Faults |
ICCAD
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
FGR
2006
IEEE
13 years 9 months ago
2006
IEEE
In this paper, we present our newly developed face expression modeling system for expression analysis and identification. Given a face image at a front view, a realistic facial mo...
ATS
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
The need for high-performance pipelined architectures has resulted in the adoption of latch based designs with multiple, interacting clocks. For such designs, time sharing across ...
ISSRE
2003
IEEE
13 years 11 months ago
2003
IEEE
Symmetries often appear as properties of many artifical settings. In Program Testing, they can be viewed as properties of programs and can be given by the tester to check the cor...