76 search results - page 2 / 16 » Impact of NBTI on FPGAs |
GLVLSI
2010
IEEE
13 years 10 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
GLVLSI
2008
IEEE
13 years 11 months ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
GLVLSI
2010
IEEE
13 years 7 months ago
2010
IEEE
Transistor aging effects (NBTI and PBTI) impact the reliability of SRAM in nano-scale CMOS technologies. In this research, the combined effect of NBTI and PBTI on power gated SRAM...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
ISQED
2010
IEEE
14 years 6 days ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...