32 search results - page 2 / 7 » Impact of Process and Temperature Variations on Network-on-C... |
INTEGRATION
2008
13 years 5 months ago
2008
Thermal gradients across the die are becoming increasingly prominent as we scale further down into the sub-nanometer regime. While temperature was never a primary concern, its non...
TVLSI
2010
12 years 12 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
In deep submicron circuits, elevation in temperatures has brought new challenges in reliability, timing, performance, cooling costs and leakage power. Conventional thermal managem...
ICCD
2007
IEEE
14 years 2 months ago
2007
IEEE
On-chip caches take a large portion of the chip area. They are much more vulnerable to parameter variation than smaller units. As leakage current becomes a significant component ...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...