15 search results - page 2 / 3 » Impact of Technology and Voltage Scaling on the Soft Error S... |
DAC
2004
ACM
13 years 8 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...