52 search results - page 1 / 11 » Improving the Test Quality for Scan-Based BIST Using a Gener... |
DAC
1999
ACM
14 years 6 months ago
1999
ACM
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
WISE
2009
Springer
14 years 2 days ago
2009
Springer
Planning out maintenance tasks to increase the quality of Web applications can be difficult for a manager. First, it is hard to evaluate the precise effect of a task on quality. S...
ICDCSW
2007
IEEE
13 years 11 months ago
2007
IEEE
Many Ubicomp appliances require the recognition of context. Existing context systems do not provide information about the quality of the context recognizied to the appliance at ru...
TSMC
1998
13 years 4 months ago
1998
Abstract—We present a general scheme for learning sensorimotor tasks which allows rapid on-line learning and generalization of the learned knowledge to unfamiliar objects. The sc...