8 search results - page 2 / 2 » Improving the testability and reliability of sequential circ... |
CEC
2008
IEEE
13 years 11 months ago
2008
IEEE
— This work is part of a project that aims to develop and operate integrated evolvable hardware systems using unconstrained evolution. Experiments are carried out on an evolvable...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
ICCAD
2010
IEEE
13 years 3 months ago
2010
IEEE
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...