39 search results - page 7 / 8 » Improving yield and reliability of chip multiprocessors |
DAC
2004
ACM
14 years 6 months ago
2004
ACM
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
DAC
2011
ACM
12 years 5 months ago
2011
ACM
Clock tree synthesis is one of the most important and challenging problems in 3D ICs. The clock signals have to be delivered by through-silicon vias (TSVs) to different tiers with...
ISCA
2011
IEEE
12 years 9 months ago
2011
IEEE
Today’s chip-level multiprocessors (CMPs) feature up to a hundred discrete cores, and with increasing levels of integration, CMPs with hundreds of cores, cache tiles, and specia...