A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
This paper introduces an accurate and efficient electrical analysis of logic gates modeled as Multiple Voltage Threshold Models (MVTM) loaded by the associated interconnect. MVTMs...
Peter Feldmann, Soroush Abbaspour, Debjit Sinha, G...
On-chip supply networks are playing an increasingly important role for modern nanometer-scale designs. However, the ever growing sizes of power grids make the analysis problem ext...
Digital circuits with feedback loops can solve some instances of NP-hard problems by relaxation: the circuit will either oscillate or settle down to a stable state that represents...
Paul Cockshott, Andreas Koltes, John O'Donnell, Pa...
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...