- The intrinsic capability brought by each new technology node opens the way to a broad range of system integration options and continuously enables new applications to be integrat...
Maurizio Paganini, Georg Kimmich, Stephane Ducrey,...
A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of ...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex intgrated systems including analog, mixed...
Manuel J. Barragan Asian, Gloria Huertas, Adoraci&...
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev