4 search results - page 1 / 1 » Layout-aware pseudo-functional testing for critical paths co... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ICCAD
2003
IEEE
13 years 10 months ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Power supply noise increases the circuit delay, which may lead to performance failure of a design. Decoupling capacitance (decap) addition is effective in reducing the power suppl...