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VLSID
2005
IEEE
170views VLSI» more  VLSID 2005»
13 years 10 months ago
A High-Efficiency, Dual-Mode, Dynamic, Buck-Boost Power Supply IC for Portable Applications
Abstract—Integrated power supplies are critical building blocks in stateof-the-art portable applications, where they efficiently and accurately transform a battery supply into va...
Biranchinath Sahu, Gabriel A. Rincón-Mora
TVLSI
2008
197views more  TVLSI 2008»
13 years 4 months ago
Leakage Minimization of SRAM Cells in a Dual-Vt and Dual-Tox Technology
-- Aggressive CMOS scaling results in low threshold voltage and thin oxide thickness for transistors manufactured in deep submicron regime. As a result, reducing the subthreshold a...
Behnam Amelifard, Farzan Fallah, Massoud Pedram
JCP
2008
141views more  JCP 2008»
13 years 4 months ago
Leakage Controlled Read Stable Static Random Access Memories
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
ASPDAC
2006
ACM
157views Hardware» more  ASPDAC 2006»
13 years 10 months ago
Delay modeling and static timing analysis for MTCMOS circuits
- One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a delay modeling and static timing analysis (STA) methodology ta...
Naoaki Ohkubo, Kimiyoshi Usami