3 search results - page 1 / 1 » Logic soft errors in sub-65nm technologies design and CAD ch... |
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...