14 search results - page 2 / 3 » Mapping statistical process variations toward circuit perfor... |
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— Recent advances in statistical timing analysis (SSTA) achieve great success in computing arrival times under variations by extending sum and maximum operations to random variab...
DAC
2004
ACM
13 years 8 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...