19 search results - page 1 / 4 » March Tests for Word-Oriented Memories |
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
EDCC
1999
Springer
13 years 9 months ago
1999
Springer
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establi...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...