81 search results - page 1 / 17 » Methods to reduce test application time for accumulator-base... |
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...