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ICCAD
2006
IEEE
169views Hardware» more  ICCAD 2006»
14 years 1 months ago
Microarchitecture parameter selection to optimize system performance under process variation
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
Xiaoyao Liang, David Brooks
HPCA
2009
IEEE
13 years 11 months ago
Soft error vulnerability aware process variation mitigation
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
Xin Fu, Tao Li, José A. B. Fortes
HPCA
2006
IEEE
14 years 5 months ago
Construction and use of linear regression models for processor performance analysis
Processor architects have a challenging task of evaluating a large design space consisting of several interacting parameters and optimizations. In order to assist architects in ma...
P. J. Joseph, Kapil Vaswani, Matthew J. Thazhuthav...
DAC
2010
ACM
13 years 8 months ago
Performance yield-driven task allocation and scheduling for MPSoCs under process variation
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...
Lin Huang, Qiang Xu
DAC
1996
ACM
13 years 8 months ago
Optimal Clock Skew Scheduling Tolerant to Process Variations
1- A methodology is presented in this paper for determining an optimal set of clock path delays for designing high performance VLSI/ULSI-based clock distribution networks. This met...
José Luis Neves, Eby G. Friedman