47 search results - page 2 / 10 » Minimizing the Impact of Scan Compression |
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
ICIP
2010
IEEE
13 years 3 months ago
2010
IEEE
Optical scanning holography is a form of digital holographic system, which allows us to capture a three-dimensional (3D) object in the two-dimensional (2D) hologram. A postprocess...
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
ICASSP
2010
IEEE
13 years 5 months ago
2010
IEEE
In this paper we propose a novel wide-band spectrum sensing scheme using compressive sensing. The wide-band signal is fed into a number of wide-band filters and the outputs of th...