47 search results - page 3 / 10 » Minimizing the Impact of Scan Compression |
VTS
2003
IEEE
13 years 11 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
DCC
2010
IEEE
13 years 9 months ago
2010
IEEE
We explore several local and global strategies for adaptive scan ordering of transform coefficients in JPEG XR/HD Photo. This codec applies a global adaptive scan-order heuristic ...
DFT
2005
IEEE
13 years 8 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
CVPR
2008
IEEE
14 years 8 months ago
2008
IEEE
Compressed sensing, an emerging multidisciplinary field involving mathematics, probability, optimization, and signal processing, focuses on reconstructing an unknown signal from a...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...