33 search results - page 2 / 7 » Model-Based Optimization of Testing through Reduction of Sti... |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
SAB
2010
Springer
13 years 3 months ago
2010
Springer
Abstract. For autonomy in underwater robotics it is essential to develop context-driven controllers, capable of leading from perception to action without human intervention. One of...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power ...
ETS
2010
IEEE
13 years 6 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
WCE
2007
13 years 6 months ago
2007
— In this paper a new approach to optimize nuclear power plant designs based on global risk reduction are described. In design the focus is on as components quality as redundancy...