170 search results - page 2 / 34 » Modeling and analyzing NBTI in the presence of Process Varia... |
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 3 hour ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
DAC
2009
ACM
14 years 6 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
JMLR
2010
13 years 1 days ago
2010
We introduce a variational inference framework for training the Gaussian process latent variable model and thus performing Bayesian nonlinear dimensionality reduction. This method...
ISPW
2011
IEEE
12 years 9 months ago
2011
IEEE
Software process models are sophisticated and large specifications aimed at organizing and managing software development. Their formal specification demands an enormous effort,...
TNN
2010
12 years 12 months ago
2010
Abstract--In experimental and observational sciences, detecting atypical, peculiar data from large sets of measurements has the potential of highlighting candidates of interesting ...