5 search results - page 1 / 1 » Multi-tone Testing of Linear and Nonlinear Analog Circuits U... |
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
VLSID
2010
IEEE
13 years 8 months ago
2010
IEEE
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
APCCAS
2006
IEEE
13 years 8 months ago
2006
IEEE
This paper considers z-domain transfer functions whose denominator polynomial possesses the property that the coefficient of zi is greater than the coefficient of zi-1 . Such trans...
DAC
1996
ACM
13 years 9 months ago
1996
ACM
Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...