13 search results - page 2 / 3 » Multiple Design Error Diagnosis and Correction in Digital VL... |
DAC
2005
ACM
13 years 7 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
DAC
2010
ACM
13 years 8 months ago
2010
ACM
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. I...
VLSID
2009
IEEE
14 years 5 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
ISQED
2005
IEEE
13 years 10 months ago
2005
IEEE
Recently, a new Dynamic Voltage Scaling (DVS) scheme has been proposed that increases energy efficiency significantly by allowing the processor to operate at or slightly below the...