5 search results - page 1 / 1 » N-distinguishing Tests for Enhanced Defect Diagnosis |
ATS
2009
IEEE
14 years 1 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
DATE
2009
IEEE
13 years 12 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
Dependability is an important attribute for microfluidic biochips that are used for safety-critical applications such as point-of-care health assessment, air-quality monitoring, a...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
: Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance....