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» N-distinguishing Tests for Enhanced Defect Diagnosis
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ATS
2009
IEEE
117views Hardware» more  ATS 2009»
14 years 5 months ago
N-distinguishing Tests for Enhanced Defect Diagnosis
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith...
DATE
2009
IEEE
94views Hardware» more  DATE 2009»
14 years 5 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
ETS
2007
IEEE
81views Hardware» more  ETS 2007»
14 years 5 months ago
Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips
Dependability is an important attribute for microfluidic biochips that are used for safety-critical applications such as point-of-care health assessment, air-quality monitoring, a...
Tao Xu, Krishnendu Chakrabarty
ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
14 years 2 months ago
Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Ch...
ITC
1997
IEEE
121views Hardware» more  ITC 1997»
14 years 3 months ago
BIST-Based Diagnostics of FPGA Logic Blocks
: Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance....
Charles E. Stroud, Eric Lee, Miron Abramovici