30 search results - page 1 / 6 » New Schemes for Self-Testing RAM |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bitor word-oriented and...
IACR
2011
12 years 4 months ago
2011
With the gaining popularity of remote storage (e.g. in the Cloud), we consider the setting where a small, protected local machine wishes to access data on a large, untrusted remot...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
VTS
1995
IEEE
13 years 8 months ago
1995
IEEE
In this paper, we propose an entirely new Built-In Self Test scheme for high-level synthesis of data path architectures that makes use of the arithmetic blocks in the data path to...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
The paper introduces the new concept of symmetric transparent BIST for RAMs. This concept allows to skip the signature prediction phase of conventional transparent BIST approaches...