853 search results - page 1 / 171 » New test approach for embedded applications |
SE
2007
13 years 6 months ago
2007
: This paper is a tutorial on the principles and applications of static tion by Abstract Interpretation to development, verification and validation ded applications. The topics cov...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
JAVACARD
2000
13 years 8 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...