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ISQED
2007
IEEE
148views Hardware» more  ISQED 2007»
13 years 11 months ago
On Accelerating Soft-Error Detection by Targeted Pattern Generation
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
13 years 11 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
GLOBECOM
2006
IEEE
13 years 11 months ago
Cyclic Codes Tailored to a Known Set of Error Patterns
— We propose a high-rate error-pattern control code based on a generator polynomial targeting a specific set of known dominant error patterns. This code is based on first const...
Jihoon Park, Jaekyun Moon
AIPR
2005
IEEE
13 years 10 months ago
Hyperspectral Detection Algorithms: Operational, Next Generation, on the Horizon
Abstract—The multi-band target detection algorithms implemented in hyperspectral imaging systems represent perhaps the most successful example of image fusion. A core suite of su...
A. Schaum
ATS
2003
IEEE
105views Hardware» more  ATS 2003»
13 years 10 months ago
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...